1Ellipsometry: a technique for real time monitoring and analysis of MBE-grown CdHgTe and CdTe/HgTe superlattices.

HARTLEY R H; CARR D; REES D; VARGA I K; KUMAR V; SHEN G; STEELE T A; BUSKES H; LEE J B

Art

J-GLOBAL ID：200902002065980716 Reference number：92A0316826

1Ellipsometry: a technique for real time monitoring and analysis of MBE-grown CdHgTe and CdTe/HgTe superlattices.

エリプソメトリー MBE成長させたCdHgTeとCdTe/HgTe超格子の実時間モニタリングと解析のための方法

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Material：
Volume： 117 Issue： 1/4 Page： 166-170 Publication year： Feb. 1992
JST Material Number： B0942A ISSN： 0022-0248 Document type： Article
Article type：原著論文 Country of issue： Netherlands (NLD) Language： ENGLISH (EN)

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Semiconductor thin films , Techniques and equipment of thin film deposition , 半導体-半導体接触【’81~’92】 , Materials of solid-state devices

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