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ArticleJ-GLOBAL ID:200902002087585950整理番号:82A0084847

Measurements at low temperatures on AlMg thin-film resistors.

AlMg薄膜抵抗に関する低温測定

著者:ANDREONE D(Inst. Elettrotecnico Nazionale Galileo Ferraris, Italy)、ARRI E(Inst. Elettrotecnico Nazionale Galileo Ferraris, Italy)、BOELLA G(Inst. Elettrotecnico Nazionale Galileo Ferraris, Italy)・・・
資料名:Proc Int Cryog Eng Conf 巻:8th ページ:802-806
発行年:1980年
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