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ArticleJ-GLOBAL ID:200902002098086190整理番号:84A0163095

High resolution, top entry goniometers for use in the JEOL transmission electron microscopes.

JEOL社の透過電子顕微鏡に用いる高解像トップエントリ方式ゴニオメータ

著者:DONOVAN P(Univ. Cambridge)、EVERATT P(Cambridge Fine Instruments, UK)、SELF P G(Arizona State Univ.)・・・
資料名:J Phys E 巻:16 号:12 ページ:1242-1246
発行年:1983年12月
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