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ArticleJ-GLOBAL ID:200902015481683709整理番号:85A0201610

特集:材料の表面と内部非破壊分析 電子線超音波顕微鏡による材料分析の現状と将来

Material characterization by electron beam acoustic microscopy(EAM): Present and future.

著者:生駒俊明(東大生産技研)、田中潤一(芝浦工大工)
資料名:材料技術 巻:3 号:1 ページ:14-23
発行年:1985年01月
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

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J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
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The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.