Art
J-GLOBAL ID：200902015490580114   Reference number：85A0421616

Hardware that simplifies the testing process by making chip and module test compatible.

チップ検査とモジュール検査に互換性をもたせることにより検査工程を簡単化するハードウエア
Author (2)：
OSTAPKO D L

About OSTAPKO D L

(IBM Corp.)

About IBM Corp.

, 
SAVIR J

About SAVIR J

(IBM Corp.)

About IBM Corp.


Material：
IBM Technical Disclosure Bulletin  (IBM Tech Disclosure Bull)

About IBM Technical Disclosure Bulletin


Volume： 27  Issue： 7A  Page： 3829  Publication year： Dec. 1984 
JST Material Number： E0292B  ISSN： 0018-8689  CODEN： IBMTA  Document type： Article
Article type： 解説  Country of issue： United States (USA)  Language： ENGLISH (EN)
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circuit module

About circuit module

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
チップ【IC】

About チップ【IC】


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JST classification (2)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

,  Digital computer hardwares in general 
(JC04010C)

About Digital computer hardwares in general

Terms in the title (5)：
Terms in the title
Keywords automatically extracted from the title.
検査

About 検査

, 
モジュール

About モジュール

, 
互換性

About 互換性

, 
検査工程

About 検査工程

, 
ハードウエア

About ハードウエア


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