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ArticleJ-GLOBAL ID:200902015503618442整理番号:86A0328958

Measurement of edge-intersecting features in SEM images.

走査電子顕微鏡(SEM)像におけるエッジ交さ特性の測定

著者:RUSS J C(North Carolina State Univ.)、HARE T M(North Carolina State Univ.)
資料名:Microbeam Anal 巻:20th ページ:133-136
発行年:1985年
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About J-GLOBAL

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