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ArticleJ-GLOBAL ID:200902015512335399整理番号:86A0507622

Electromigration lifetime enhancement in multi-level metallization.

多層メタル化における耐エレクトロマイグレーション寿命の改善

資料名:IBM Tech Disclosure Bull 巻:28 号:6 ページ:2667-2668
発行年:1985年11月
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.