Art
J-GLOBAL ID：200902015518614788   Reference number：84A0063644

Hot electron reliability modeling in VLSI devices.

VLSIデバイス中のホットエレクトロン信頼性モデリング
Author (3)：
ITO A

About ITO A

(Harris, Florida)

About Harris, Florida

, 
SWASEY H A

About SWASEY H A

(Harris, Florida)

About Harris, Florida

, 
GEORGE E W

About GEORGE E W

(Harris, Florida)

About Harris, Florida


Material：
Annual Proceedings. IEEE International Reliability Physics Symposium  (IRPS)

About Annual Proceedings. IEEE International Reliability Physics Symposium


Volume： 21st  Page： 96-101  Publication year： 1983 
JST Material Number： A0631A  ISSN： 1541-7026  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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VLSI

About VLSI

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

,  Semiconductor integrated circuit 
(NC03162T)

About Semiconductor integrated circuit

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
VLSI

About VLSI

, 
ホットエレクトロン

About ホットエレクトロン

, 
信頼性モデリング

About 信頼性モデリング


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