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ArticleJ-GLOBAL ID:200902015522060827整理番号:86A0404441

Silicon surface roughness - Structural observation by reflection electron microscopy.

シリコンの表面粗さ 反射電子顕微鏡による構造観察

著者:HONDA K(Fujitsu Lab. Ltd., Kawasaki)、OHSAWA A(Fujitsu Lab. Ltd., Kawasaki)、TOYOKURA N(Fujitsu Lab. Ltd., Kawasaki)
資料名:Appl Phys Lett 巻:48 号:12 ページ:779-781
発行年:1986年03月24日
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.