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J-GLOBAL ID:200902015531648888   Reference number:90A0108521

ISOVPE growth post-growth annealing and characterization of Hg1-xCdxTe layers.

Hg1-xCdxTe層の等温VPE成長,成長後熱処理と特性
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Volume:Issue:Page: 313-317  Publication year: Aug. 1989 
JST Material Number: E0935A  ISSN: 0167-577X  Document type: Article
Article type: 短報  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
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Semiconductor thin films  ,  Electric conduction in crystalline semiconductors 
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