Art
J-GLOBAL ID：200902015537390017   Reference number：87A0023431

Characteristics of the spectrum of IR radiation reflected by silicon diffusion layers with high charge-carrier densities.

高い電荷担体密度をもつけい素拡散層によって反射された赤外放射スペクトルの特性
Author (2)：
BARANOV L I

About BARANOV L I

, 
GUSEV YU YU

About GUSEV YU YU


Material：
Journal of Applied Spectroscopy

About Journal of Applied Spectroscopy


Volume： 43  Issue： 6  Page： 1353-1355  Publication year： Jun. 1986 
JST Material Number： B0784B  ISSN： 0021-9037  CODEN： JASYAP  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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silicon

About silicon

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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carrier

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JST classification (1)：
JST classification
Category name(code) classified by JST.
Infrared spectra,Raman scattering and Raman spectra of inorganic compounds 
(BM08063C)

About Infrared spectra,Raman scattering and Raman spectra of inorganic compounds

Terms in the title (6)：
Terms in the title
Keywords automatically extracted from the title.
電荷担体

About 電荷担体

, 
密度

About 密度

, 
けい素

About けい素

, 
拡散層

About 拡散層

, 
赤外放射

About 赤外放射

, 
スペクトル

About スペクトル


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