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ArticleJ-GLOBAL ID:200902015542371330整理番号:85A0191202

Effect of particle fluence on track diameter and response of electrochemically etched SSNTD.

電気化学的にエッチされたSSNTDの飛跡直径と応答に対する粒子フルエンス効果

著者:TUREK K(Inst. Radiation Dosimetry of the Czechoslovak Academy of Sciences)、DAJK<span style=text-decoration:overline>O ́</span> G(Inst. Nuclear Research, Hungary)
資料名:Int J Radiat Appl Instrum Part D 巻:8 号:1/4 ページ:121-124
発行年:1984年
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