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ArticleJ-GLOBAL ID:200902015546798568整理番号:90A0442621

Scanning electron microscope-based metrological electron microscope system and new prototype scanning electron microscope magnification standard.

走査電子顕微鏡に基づいた度量衡学的電子顕微鏡システムと新試作走査電子顕微鏡倍率標準

著者:POSTEK M T(National Inst. Standards and Technology, MD)
資料名:Scanning Microsc 巻:3 号:4 ページ:1087-1099
発行年:1989年12月
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.