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ArticleJ-GLOBAL ID:200902015552262440整理番号:92A0484137

ICTS法によるZnOバリスタの電極界面の評価

Characterization of Trap centers at interface of electorode-ZnO grains by ICTS.

著者:上野靖司(村田製作所)、中山晃慶(村田製作所)、中村和敬(村田製作所)・・・
資料名:日本セラミックス協会年会講演予稿集 巻:1992 ページ:448
発行年:1992年05月
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