Art
J-GLOBAL ID:200902015556955807   Reference number:86A0236794

On the influence of an external D.C. substrate bias on boron and phosphorus doping efficiencies in a-Si:H.

a-Si:Hのほう素とりんのドーピング効率に及ぼす外部dc基板バイアスの効果
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Material:
Volume: 77/78  Issue: Pt1  Page: 527-530  Publication year: Dec. 1985 
JST Material Number: D0642A  ISSN: 0022-3093  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
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Electric conduction in amorphous and liquid semiconductors  ,  半導体-半導体接触【’81~’92】  ,  Lattice defects in semiconductors 
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