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Articleの詳細情報

ArticleJ-GLOBAL ID:200902015563238134整理番号:93A0543920

Identification Of Critical Substrate Process Variables Affecting Wirebonding.

ワイヤボンドに影響するクリティカルな基板プロセス変動の識別

著者:VAUGHAN I(Westinghouse Electric Corp., MD)、HOGAN B(Westinghouse Electric Corp., MD)、ALEXANDER M(Westinghouse Electric Corp., MD)
資料名:Proc Int Symp Microelectron 巻:1992 ページ:491-496
発行年:1992年
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.