Art
J-GLOBAL ID:200902015564158371   Reference number:84A0121957

E ́tude des interfaces dielectrique/semiconducteur par ellipsometrie spectroscopique.

分光エリプソメータによる誘電体/半導体の界面の研究
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Material:
Volume: 24  Issue:Page: 217-227  Publication year: 1981 
JST Material Number: A0308A  ISSN: 0001-558X  CODEN: ACELA  Document type: Article
Article type: 原著論文  Country of issue: France (FRA)  Language: FRENCH (FR)
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Oxide thin films  ,  Structure determination and diffraction crystallography in general 
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