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ArticleJ-GLOBAL ID:200902015580902013整理番号:91A0033808

ラマン分光法によるInAs/GaAs界面の評価

Characterization of InAs/GaAs heterostructure by Raman spectroscopy.

著者:森口幸久(名古屋工大)、市村正也(名古屋工大)、宇佐美晶(名古屋工大)・・・
資料名:応用物理学会学術講演会講演予稿集 巻:51st 号:3 ページ:1098
発行年:1990年09月
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