Art
J-GLOBAL ID：200902015594742078   Reference number：83A0189197

On the origin of adsorption stress in thin porous films.

多孔性薄膜における吸着応力の起因
Author (1)：
HIRSCH E H

About HIRSCH E H

(Electronics Research Lab. Dep. Defence, Australia)

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Material：
Journal of Physics. D. Applied Physics  (J Phys D)

About Journal of Physics. D. Applied Physics


Volume： 15  Issue： 10  Page： 1991-2002  Publication year： Oct. 14, 1982 
JST Material Number： B0092B  ISSN： 0022-3727  CODEN： JPAPBE  Document type： Article
Article type： 原著論文  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)
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magnesium fluoride

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,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
pressure dependence

About pressure dependence

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JST classification (2)：
JST classification
Category name(code) classified by JST.
Solid-gos interface in general. 
(CB12041H)

About Solid-gos interface in general.

,  Mechanical properties of solids in general 
(BL01021C)

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Terms in the title (5)：
Terms in the title
Keywords automatically extracted from the title.
多孔性

About 多孔性

, 
薄膜

About 薄膜

, 
吸着

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, 
応力

About 応力

, 
起因

About 起因


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