Art
J-GLOBAL ID：200902015614491140   Reference number：86A0299882

Automatic design of exhaustively self-testing chips with BILBO modules.

BILBOモジュールを用いた徹底的な自己診断素子チップの自動設計
Author (2)：
KRASNIEWSKI A

About KRASNIEWSKI A

(Univ. Rochester, N.Y.)

About Univ. Rochester, N.Y.

, 
ALBICKI A

About ALBICKI A

(Univ. Rochester, N.Y.)

About Univ. Rochester, N.Y.


Material：
Proceedings. International Test Conference  (Proc Int Test Conf)

About Proceedings. International Test Conference


Volume： 1985  Page： 362-371  Publication year： 1985 
JST Material Number： E0211B  ISSN： 1089-3539  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
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All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
fault diagnosis

About fault diagnosis

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
BILBOモジュール

About BILBOモジュール


   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=86A0299882&from=J-GLOBAL&jstjournalNo=E0211B") }}
JST classification (1)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
モジュール

About モジュール

, 
自己診断

About 自己診断

, 
素子チップ

About 素子チップ

, 
自動設計

About 自動設計


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