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ArticleJ-GLOBAL ID:200902015654391423整理番号:85A0292928

X-ray diffraction measurement of residual stress in P.V.D. silver coatings on metal alloy substrates.

合金基板上のP.V.D.銀皮膜層中の残留応力のX線回折による測定

著者:SHACKELFORD J F(Univ. California)、STROUD R D(Univ. California)
資料名:Int Adv Nondestr Test 巻:10 ページ:333-345
発行年:1984年
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