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ArticleJ-GLOBAL ID:200902015662646570整理番号:83A0197106

Atomic and molecular ion emission from silica in laser microprobe mass analysis (LAMMA): Comparison with secondary ion mass spectrometry (SIMS) and spark source mass spectrometry (SSMS).

レーザ顕微質量分析(LAMMA)におけるシリカからの原子および分子イオン 二次イオン質量分析法(SIMS)およびスパークソース質量分析法(SSMS)との比較

著者:MICHIELS E(Univ. Antwerp, Belgium)、CELIS A(Univ. Antwerp, Belgium)、GIJBELS R(Univ. Antwerp, Belgium)
資料名:Int J Mass Spectrom Ion Phys 巻:47 ページ:23-26
発行年:1983年01月
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