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ArticleJ-GLOBAL ID:200902015664574178整理番号:91A0256686

Secondary electron emission spectroscopy: A sensitive and novel method for the characterization of the near-surface region of diamond and diamond films.

二次電子放出分光:ダイヤモンドおよびダイヤモンド膜表面近傍の評価をするための高感度な新しい方法

著者:HOFFMAN A(Victoria Univ. Technology (RMIT), Vic., AUS)、PRAWER S(Victoria Univ. Technology (RMIT), Vic., AUS)、FOLMAN M(Technion, Israel Inst. Technology, Haifa, ISR)
資料名:Appl Phys Lett 巻:58 号:4 ページ:361-363
発行年:1991年01月28日
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About J-GLOBAL

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