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J-GLOBAL ID：200902015666314866   Reference number：92A0040187

Reliability of code density test for high resolution ADCs.

高分解能ADCに対するコード密度テストの信頼性
Author (2)：
GINETTI B

About GINETTI B

(Univ. Catholique de Louvain, Louvain-la-Neuve, BEL)

About Univ. Catholique de Louvain, Louvain-la-Neuve, BEL

, 
JESPERS P

About JESPERS P

(Univ. Catholique de Louvain, Louvain-la-Neuve, BEL)

About Univ. Catholique de Louvain, Louvain-la-Neuve, BEL


Material：
Electronics Letters  (Electron Lett)

About Electronics Letters


Volume： 27  Issue： 24  Page： 2231-2233  Publication year： Nov. 21, 1991 
JST Material Number： A0887A  ISSN： 0013-5194  CODEN： ELLEAK  Document type： Article
Article type： 短報  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)
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AD conversion

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,...
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JST classification (1)：
JST classification
Category name(code) classified by JST.
AD/DA conversion circuits 
(NC05080M)

About AD/DA conversion circuits

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
高分解能

About 高分解能

, 
ADC

About ADC

, 
密度

About 密度

, 
テスト

About テスト


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