Art
J-GLOBAL ID:200902015674126424   Reference number:92A0432254

Electric Field Dependence of Hole Transit Time in TOF Experiments in a-Si:H.

a-Si:HのTOFの正孔飛行時間の電場依存性
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Material:
Volume: 39th  Issue: Pt 2  Page: 757  Publication year: Mar. 1992 
JST Material Number: Y0054A  Document type: Proceedings
Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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