Art
J-GLOBAL ID：200902015680481864   Reference number：92A0532738

On the Question about Secondary Electron Image Quality.

二次電子像の像質に関する疑問
Author (1)：
GROMOVA T I

About GROMOVA T I

(Moscow Inst. Fine Chemical Technology, Moscow, SUN)

About Moscow Inst. Fine Chemical Technology, Moscow, SUN


Material：
Journal of Electron Microscopy  (電子顕微鏡学会誌)

About Journal of Electron Microscopy


Volume： 41  Issue： 3  Page： 193-195  Publication year： Jun. 1992 
JST Material Number： G0104A  ISSN： 0022-0744  Document type： Article
Article type： 短報  Country of issue： Japan (JPN)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
scanning electron microscope

About scanning electron microscope

,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=92A0532738&from=J-GLOBAL&jstjournalNo=G0104A") }}
JST classification (1)：
JST classification
Category name(code) classified by JST.
Microscopy determination of structures 
(BK01040E)

About Microscopy determination of structures

Terms in the title (2)：
Terms in the title
Keywords automatically extracted from the title.
二次電子

About 二次電子

, 
像質

About 像質


Return to Previous Page

TOP

BOTTOM