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ArticleJ-GLOBAL ID:200902015697207766整理番号:91A0069460

Low angle x-ray reflection study of ultrathin Ge films on (100)Si.

Si(100)上のGe超薄膜の小角X線反射研究

著者:BARIBEAU J‐M(National Research Council Canada, Ottawa, CAN)
資料名:Appl Phys Lett 巻:57 号:17 ページ:1748-1750
発行年:1990年10月22日
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