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J-GLOBAL ID：200902015704643860   Reference number：90A0532670

Electron spectroscopic diffraction at (111) silicon foils.

Author (2)：
REIMER L

About REIMER L

(Univ. Muenster, Muenster, DEU)

About Univ. Muenster, Muenster, DEU

, 
FROMM I

About FROMM I

(Univ. Muenster, Muenster, DEU)

About Univ. Muenster, Muenster, DEU


Material：
Proceedings. Annual Meeting. Electron Microscopy Society of America  (Proc Annu Meet Electron Microsc Soc Am)

About Proceedings. Annual Meeting. Electron Microscopy Society of America


Volume： 47th  Page： 382-383  Publication year： 1989 
JST Material Number： A0878B  Document type： Proceedings
Country of issue： United States (USA)  Language： ENGLISH (EN)

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