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ArticleJ-GLOBAL ID:200902015706258409整理番号:90A0126881

Passive film breakdown at grain boundary junctions in high purity nickel.

高純度ニッケルにおける粒界接合個所での不動態皮膜の破壊

著者:PALUMBO G(Univ. Toronto, Toronto, CAN)、AUST K T(Univ. Toronto, Toronto, CAN)
資料名:Proc Int Symp Adv Struct Mater 1988 ページ:227-233
発行年:1989年
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