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J-GLOBAL ID：200902018975049670
Reference number：90A0415151
Influence of the mean crystal potential on the Fresnel fringes in cross-sectional transmission electron microscopy bright-field images of a flat projecting Si/SiO2 interface.
平面投影したSi/SiO2界面の断面透過電子顕微鏡明視野像におけるFresnel縞に及ぼす平均結晶ポテンシャルの影響
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Author (3)：
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Material：
Volume：
61
Issue：
1
Page：
35-43
Publication year：
Jan. 1990
JST Material Number：
E0753B
ISSN：
0141-8610
CODEN：
PMAADG
Document type：
Article
Article type：
原著論文
Country of issue：
United Kingdom (GBR)
Language：
ENGLISH (EN)
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Microscopy determination of structures
, 金属-絶縁体-半導体構造【’81~’92】
Terms in the title (9)：
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