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ArticleJ-GLOBAL ID:200902018975049670整理番号:90A0415151

Influence of the mean crystal potential on the Fresnel fringes in cross-sectional transmission electron microscopy bright-field images of a flat projecting Si/SiO2 interface.

平面投影したSi/SiO2界面の断面透過電子顕微鏡明視野像におけるFresnel縞に及ぼす平均結晶ポテンシャルの影響

著者:WURZINGER P(Technische Univ. Wien, Wien, AGT)、PONGRATZ P(Technische Univ. Wien, Wien, AGT)、SKALICKY P(Technische Univ. Wien, Wien, AGT)
資料名:Philos Mag A 巻:61 号:1 ページ:35-43
発行年:1990年01月
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