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ArticleJ-GLOBAL ID:200902019078869377整理番号:86A0418091

Resistivity of thin films of the palladium-hydrogen system as a function of film thickness.

薄膜の厚さの関数としてのPd‐H系の薄膜の固有抵抗

著者:LEE M‐W(Univ. Texas at Dallas)、GLOSSER R(Univ. Texas at Dallas)
資料名:Z Phys Chem Neue Folge 巻:147 号:1/2 ページ:27-32
発行年:1986年
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