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ArticleJ-GLOBAL ID:200902019101711646整理番号:85A0475955

Thickness measurement on electronic connectors: The key to plating process control.

電子部品用コネクタの膜厚測定 めっきのプロセス制御に対するかぎ

著者:HOFFMAN P L(E.I. Du Pont Co., PA)
資料名:Plat Surf Finish 巻:72 号:9 ページ:20-23
発行年:1985年09月
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.