Art
J-GLOBAL ID：200902023140042368   Reference number：89A0155690

External ion source FTMS instrument for analysis of high mass ions.

高質量イオン分析用の外部イオン源FTMS装置
Author (3)：
LEBRILLA C B

About LEBRILLA C B

(Univ. California, CA, USA)

About Univ. California, CA, USA

, 
AMSTER I J

About AMSTER I J

(Univ. California, CA, USA)

About Univ. California, CA, USA

, 
MCIVER R T JR

About MCIVER R T JR

(Univ. California, CA, USA)

About Univ. California, CA, USA


Material：
International Journal of Mass Spectrometry and Ion Processes  (Journal of Mass Spectrometry and Ion Processes)

About International Journal of Mass Spectrometry and Ion Processes


Volume： 87  Issue： 1  Page： R7-R13  Publication year： Jan. 01, 1989 
JST Material Number： D0625A  ISSN： 0168-1176  Document type： Article
Article type： 短報  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
electron impact ionization mass spectrometry

About electron impact ionization mass spectrometry

,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=89A0155690&from=J-GLOBAL&jstjournalNo=D0625A") }}
JST classification (1)：
JST classification
Category name(code) classified by JST.
Mass spectrometers 
(BD02060M)

About Mass spectrometers

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
質量

About 質量

, 
イオン

About イオン

, 
分析

About 分析

, 
イオン源

About イオン源


Return to Previous Page

TOP

BOTTOM