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ArticleJ-GLOBAL ID:200902023150056413整理番号:88A0031675

Sensitivity of metastable operation to layout parasitic elements in CMOS RS flip-flops.

CMOS RSフリップフロップにおけるレイアウト寄生要素に対する準安定動作の感度

著者:KACPRZAK T(Univ. Rochester, NY, USA)、MOLYNEAUX R(Univ. Rochester, NY, USA)
資料名:Proc IEEE Midwest Symp Circuits Syst 巻:29th ページ:313-316
発行年:1987年
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