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ArticleJ-GLOBAL ID:200902023230144194整理番号:90A0330479

Measuring adapter efficiency using a sliding short circuit.

可動短絡回路を用いたアダプタの効率の測定

著者:DAYWITT W C(National Inst. Standards and Technology, CO)、COUNAS G(National Inst. Standards and Technology, CO)
資料名:IEEE Trans Microw Theory Tech 巻:38 号:3 ページ:231-237
発行年:1990年03月
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.