Art
J-GLOBAL ID：200902023319209320   Reference number：89A0169186

LAMMS analysis of Schottky barrier diode leakage.

Schottky障壁ダイオードリークのLAMMA分析
Author (3)：
DANIEL W M

About DANIEL W M

(IBM-East Fishkill, NY, USA)

About IBM-East Fishkill, NY, USA

, 
DELORENZO D J

About DELORENZO D J

(IBM-East Fishkill, NY, USA)

About IBM-East Fishkill, NY, USA

, 
WILSON H R

About WILSON H R

(IBM-East Fishkill, NY, USA)

About IBM-East Fishkill, NY, USA


Material：
Microbeam Analysis  (Proceedings. Annual Conference. Microbeam Analysis Society)

About Microbeam Analysis


Volume： 23rd  Page： 365-366  Publication year： 1988 
JST Material Number： E0776B  ISSN： 0278-1727  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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Schottky barrier diode

About Schottky barrier diode

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
LAMMA analysis

About LAMMA analysis


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JST classification (1)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
Schottky障壁ダイオード

About Schottky障壁ダイオード

, 
リーク

About リーク

, 
LAMMA分析

About LAMMA分析


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