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ArticleJ-GLOBAL ID:200902051198679670整理番号:92A0230198

関数近似を利用した全可観測な順序回路のテスト生成

A Test Generation for Observable Sequential Circuits Using Approximate Differentiable Function.

著者:前川英嗣(松下電器産業 中研 電子機器基礎研)、萱嶋一弘(松下電器産業 中研 電子機器基礎研)、しめ木泰治(松下電器産業 中研 電子機器基礎研)・・・
資料名:電子情報通信学会技術研究報告 巻:91 号:474(FTS91 61-65) ページ:7-12
発行年:1992年02月20日
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.