Art
J-GLOBAL ID：200902051253915817   Reference number：90A0177726

Electronic structure of Si/disilicide interfaces.

シリコン/ジシリサイド界面の電子構造
Author (2)：
FUJITANI H

About FUJITANI H

(Fujitsu Lab. Ltd., Atsugi, JPN)

About Fujitsu Lab. Ltd., Atsugi, JPN

, 
ASANO S

About ASANO S

(Univ. Tokyo, Tokyo, JPN)

About Univ. Tokyo, Tokyo, JPN


Material：
Applied Surface Science  (Appl Surf Sci)

About Applied Surface Science


Volume： 41/42  Page： 164-168  Publication year： Nov. 1989 
JST Material Number： B0707B  ISSN： 0169-4332  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)
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All keywords is available on JDreamIII(charged).
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local density functional method

About local density functional method

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
半導体-金属接触【’81~’92】 
(BM03073E)

About 半導体-金属接触【’81~’92】

,  Electronic structure of surfaces 
(BM02080J)

About Electronic structure of surfaces

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
シリコン

About シリコン

, 
界面

About 界面

, 
電子構造

About 電子構造


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