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ArticleJ-GLOBAL ID:200902051321624966整理番号:95A0897390

An X-Ray Diffraction Method for Quantitative Adhesion Measurements of Thin-Hard Film on Metallic Substrates.

金属基板上の硬質薄膜の付着力の定量的測定のためのX線回折法

著者:LI G(Shanghai Jiaotong Univ., Shanghai, CHN)、CHEN C(Shanghai Jiaotong Univ., Shanghai, CHN)、QI X(Shanghai Jiaotong Univ., Shanghai, CHN)・・・
資料名:Proc 10th Int Conf Vac Metall 1990 Vol 2 ページ:203-208
発行年:1991年
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