Mechanism for the instability of the homogeneous surface breakdown of planar p-n<sup>-</sup>-n<sup>+</sup> junctions with metal electrodes.

EZHOV V S; KERNER B S

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J-GLOBAL ID：200902051346439829 Reference number：81A0340009

Mechanism for the instability of the homogeneous surface breakdown of planar p-n^--n⁺ junctions with metal electrodes.

金属電極を持つ平面型p-n^--n⁺接合の均一な表面絶縁破壊の不安定性のメカニズム

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Author (2)： ,
Material：
Volume： 6 Issue： 5 Page： 235-236 Publication year： May. 1980
JST Material Number： H0665A ISSN： 0360-120X CODEN： STPLD2 Document type： Article
Article type：短報 Country of issue： United States (USA) Language： ENGLISH (EN)

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半導体-半導体接触【’81~’92】

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Mechanism for the instability of the homogeneous surface breakdown of planar p-n--n+ junctions with metal electrodes.

Mechanism for the instability of the homogeneous surface breakdown of planar p-n^--n⁺ junctions with metal electrodes.