Unconnected junction contrast in ion beam induced charge microscopy.

KOLACHINA S; ONG V K S; CHAN D S H; PHANG J C H; OSIPOWICZ T; WATT F

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J-GLOBAL ID：200902131016999945 Reference number：96A0165743

Unconnected junction contrast in ion beam induced charge microscopy.

イオンビーム誘起電荷顕微鏡法における非連結接合コントラスト

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Volume： 68 Issue： 4 Page： 532-534 Publication year： Jan. 22, 1996
JST Material Number： H0613A ISSN： 0003-6951 CODEN： APPLAB Document type： Article
Article type：短報 Country of issue： United States (USA) Language： ENGLISH (EN)

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