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ArticleJ-GLOBAL ID:200902131019114987整理番号:02A0952619

最新FIB(集束イオンビーム)装置の紹介 TEM試料作製を中心としたナノ精度加工への応用

著者:完山正林(セイコーインスツルメンツ)、山本洋(セイコーインスツルメンツ)、岩崎浩二(セイコーインスツルメンツ)・・・
資料名:分析電子顕微鏡討論会予稿集 巻:18th ページ:68-73
発行年:2002年09月19日
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.