Art
J-GLOBAL ID：200902131021164860   Reference number：97A0004728

Testing ICs: Getting to the Core of the Problem.

ICの試験 問題のコアに迫る
Author (2)：
MURRAY B T

About MURRAY B T

(General Motors R&D Center)

About General Motors R&D Center

, 
HAYES J P

About HAYES J P

(Univ. Michigan)

About Univ. Michigan


Material：
Computer

About Computer


Volume： 29  Issue： 11  Page： 32-38  Publication year： Nov. 1996 
JST Material Number： B0794A  ISSN： 0018-9162  Document type： Article
Article type： 解説  Country of issue： United States (USA)  Language： ENGLISH (EN)
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semiconductor integrated circuit

About semiconductor integrated circuit

,...
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JST classification (1)：
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General 
(NC03161C)

About General

Terms in the title (3)：
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IC

About IC

, 
試験

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, 
コア

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