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J-GLOBAL ID:200902131032815382   Reference number:02A0516045

Design for Hierarchical Two-Pattern Testability of Data Paths.

データパスの階層的2パターンテスタビリティに対する設計
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Volume: E85-D  Issue:Page: 975-984  Publication year: Jun. 01, 2002 
JST Material Number: L1371A  ISSN: 0916-8532  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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