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ArticleJ-GLOBAL ID:200902131032815382整理番号:02A0516045

Design for Hierarchical Two-Pattern Testability of Data Paths.

データパスの階層的2パターンテスタビリティに対する設計

著者:ALTAF‐UL‐AMIN M(Nara Inst. Sci. and Technol., Ikoma‐shi, JPN)、OHTAKE S(Nara Inst. Sci. and Technol., Ikoma‐shi, JPN)、FUJIWARA H(Nara Inst. Sci. and Technol., Ikoma‐shi, JPN)
資料名:IEICE Trans Inf Syst (Inst Electron Inf Commun Eng) 巻:E85-D 号:6 ページ:975-984
発行年:2002年06月01日
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.