Art
J-GLOBAL ID：200902131040599389   Reference number：00A0381745

A 3D Measurement Using Modulated Pattern Projection.

変調パターン光投影に基づく3次元計測
Author (1)：
LU C

About LU C

(福岡工大 工)

About 福岡工大 工


Material：
福岡工業大学研究論集  (Research Bulletin of Fukuoka Institute of Technology)

About 福岡工業大学研究論集


Volume： 32  Issue： 2  Page： 235-242  Publication year： Mar. 15, 2000 
JST Material Number： X0506A  ISSN： 0287-6620  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： JAPANESE (JA)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
*3-D measurement

About 3-D measurement

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
変調パターン光投影

About 変調パターン光投影

,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=00A0381745&from=J-GLOBAL&jstjournalNo=X0506A") }}
JST classification (2)：
JST classification
Category name(code) classified by JST.
Graphic and image processing in general 
(JE04010I)

About Graphic and image processing in general

,  Other optical instruments and techniques 
(BD07080R)

About Other optical instruments and techniques

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
変調

About 変調

, 
投影

About 投影

, 
3次元計測

About 3次元計測


Return to Previous Page

TOP

BOTTOM