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ArticleJ-GLOBAL ID:200902131041888848整理番号:99A0632539

表面分析のケーススタディ 17 集束イオンビーム(FIB)装置による部位指定TEM用試料作製

FIB Cross-sectioning of TEM Samples at Specified Locations.

著者:富田雅人(NTT 生活環境研)、飯塚俊生(NTTアドバンステクノロジ)
資料名:表面技術 巻:50 号:7 ページ:613-617
発行年:1999年07月01日
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J-GLOBAL: Linking, Expanding and Sparking

About J-GLOBAL

Linking

J-GLOBAL links information that represents the key to research and development. For example, linking articles and patents with people (authors and inventors) enables the extraction of a sequence of information.
It’s useful for making new discoveries and uncovering new information.

Expanding

The system enables searches of similar kinds of content through linkage with external sites.
It helps you to obtain knowledge from dissimilar fields and discover concepts that cross the boundaries of specialisms.

Sparking

Through repeated linkage and expansioniteration, J-GLOBAL provides unexpected hints for problem-solving and the illumination of new ideas.