Art
J-GLOBAL ID：200902131042732019
Reference number：00A0667626
Correlation between microstructure, particle size, dielectric constant, and electrical resistivity of nano-size amorphous SiO2 powder.
ナノサイズの非晶質SiO2粉体の微小構造,粒子サイズ,誘電率および電気抵抗率の間の相関
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Author (2)：
,
Material：
Volume：
11
Issue：
8
Page：
1081-1089
Publication year：
Nov. 1999
JST Material Number：
W0435A
ISSN：
0965-9773
Document type：
Article
Article type：
原著論文
Country of issue：
United States (USA)
Language：
ENGLISH (EN)
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Oxide thin films
, Electric conduction in semiconductors and insulators in general
Terms in the title (7)：
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