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ArticleJ-GLOBAL ID:200902131045888966整理番号:97A0557889

Molecular-marker-based Genetic Analysis of Tepary Bean-derived Common Bacterial Blight Resistance in Different Developmental Stages of Common Bean.

インゲンマメの発育段階別のtepary bean由来葉焼病抵抗性の分子マーカーによる分析

著者:JUNG G(Univ. Wisconsin, WI)、SKROCH P W(Univ. Wisconsin, WI)、COYNE D P(Univ. Nebraska, NE)・・・
資料名:J Am Soc Hortic Sci 巻:122 号:3 ページ:329-337
発行年:1997年05月
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About J-GLOBAL

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