Art
J-GLOBAL ID：200902165026118280
Reference number：94A0491715
Measurement of Porosity of Porous Si by Using X-ray Refraction Effect.
X線の屈折効果を用いた多孔質Siの多孔度の測定
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Author (3)：
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,
Material：
Volume：
41st
Issue：
Pt 2
Page：
789
Publication year：
Mar. 1994
JST Material Number：
Y0054A
Document type：
Proceedings
Country of issue：
Japan (JPN)
Language：
JAPANESE (JA)
Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
,
,
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