Art
J-GLOBAL ID:200902165026118280
Reference number:94A0491715
Measurement of Porosity of Porous Si by Using X-ray Refraction Effect.
X線の屈折効果を用いた多孔質Siの多孔度の測定
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Author (3):
,
,
Material:
Volume:
41st
Issue:
Pt 2
Page:
789
Publication year:
Mar. 1994
JST Material Number:
Y0054A
Document type:
Proceedings
Country of issue:
Japan (JPN)
Language:
JAPANESE (JA)
Terms in the title (4):
Terms in the title
Keywords automatically extracted from the title.
,
,
,
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