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J-GLOBAL ID：200902165046914571
Reference number：97A0344593
High Precision Measurement of Quantized Hall Resistance: Sample Width Dependence.
量子化ホール抵抗の高精度測定:試料幅依存性
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Author (5)：
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Material：
Volume：
1996
Issue：
Autumn Pt 2
Page：
219
Publication year：
Sep. 1996
JST Material Number：
S0872B
Document type：
Proceedings
Country of issue：
Japan (JPN)
Language：
JAPANESE (JA)
Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
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