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ArticleJ-GLOBAL ID:200902165046914571整理番号:97A0344593

量子化ホール抵抗の高精度測定:試料幅依存性

High Precision Measurement of Quantized Hall Resistance: Sample Width Dependence.

著者:鈴木純児(学習院大 理)、島田貴子(学習院大 理)、深野敦之(学習院大 理)・・・
資料名:日本物理学会講演概要集(分科会) 巻:1996 号:Autumn Pt 2 ページ:219
発行年:1996年09月
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About J-GLOBAL

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